Signal testing and data analysis are an important part of most EFE automation projects. Coupled with sophisticated monitoring architectures, they form a complete control system for a variety of applications. In data acquisition and automation applications, we use a wide variety of aftermarket control interfaces, including PID controllers and process control loops, motor control, and general digital and analog I/O. In addition, we can test real world signals and analyze data rapidly and at minimal cost with National Instruments LabVIEW software.
Additional LabVIEW and PLC Capabilities/Platforms:
National Instrument LabVIEW Programming
PLC – Allen Bradley RS Logix
PLC – Siemens Step 7
PLC – Others, including Automation direct, Koyo, Panasonic
Schematic Capture/PCB Layout using various CAD packages
AutoCAD (2D and 3D)
SolidWorks (2D and 3D)
Pro/E
C# Programming
Visual Basic
Embedded Programming: C or Assembly Language on most common microcontrollers
Database Development: SQL, MS Access